Cryomagnet Limited System

This magnet is a versatile platform for measurements under a two-axis applied field and variable temperature, allowing for both turnkey and customizable capabilities to measure a wide range of material properties.

Base Capabilities

  • Vertical magnetic fields up to +/- 5 T
  • Magnetic fields at an arbitrary direction up to +/- 3T
  • Bore diameter of 37 mm
  • Sample space temperatures from 4 K to 300 K

Measurement Options

  • Vibrating sample magnetometry (VSM) for measuring DC hysteresis loops with a magnetic moment sensitivity of 10-7 Am2 over the full 5 T range, in the vertical direction only. Holders are available for thin films, bulk, powder and liquid samples. The samples must be less than 6 mm wide. Temperature during measurement can be swept from 4 K to 400 K, or from 300 K to 700 K.
  • AC Susceptibility measurements at temperatures from 4 K to 400 K with a bias field of up to 5 T, and AC excitation field of between 3 mT and 0.1 mT at 200 Hz and 10 kHz respectively.
  • Custom designed ferromagnetic resonance (FMR) spectroscopy for determination of magnetic anisotropy, magnetization and spin-dynamic damping parameters of thin films. The system uses a coplanar waveguide probe to measure FMR absorption at frequencies up to 40 GHz. The ideal sample size is 1 cm square, but other dimensions can be accommodated. Fields can be applied in plane along the direction of the waveguide (up to 3 T), out-of-plane (up to 5 T), or at any angle in between.
  • Strain-dependent FMR spectroscopy for measuring inverse magnetostriction of thin films.  The system uses a four-point bending fixture with adjustable load to strain the sample. Samples must be 1 cm square.
  • Displacement based magnetostriction measurements using a cantilever approach. Samples must be 2.5 cm long and no more than 1 cm wide. Displacements of the free end of the cantilever as small as 100 pm can be measured.
  • Room temperature magneto-optic Kerr effect (MOKE) measurements of thin film magnetization for obtaining normalized M-H loop measurements of ultra-thin films magnetized out of plane.